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Kaleo-T Optics Quality Diagnostics

Measured Elements
● Lens
● Objective, Zoom
● Strongly aberrated subassembly

Applications
● New product development
● Process optimization
● Cost-effective alignment of objectives

GET THE MTF...
● Along any direction
● For any pupil size
● On and off-axis
● Up to cut-off frequency
● With various focusing methods

... and wavefront quality
● EFL, F#, NA
● Aberrations: Zernike, Seidel
● Real time filtering of phase map (Zernike, Kernel…)
● Through focus MTF
● Comparison to design
● Chromatic aberrations
  • 型號
  • 產品概述
  • 庫存
  • 詢價數量
  • 詢價車
Kaleo-T-UV HR

Wavelength range: 190–400 nm

  •  Wavelength range  190–400 nm
     Aperturedimension (mm²)  8.0 x 8.0
     Spatial resolution  32 μm
     Phase and intensity sampling  250 x 250
     Accuracy (Absolute)  10 nm RMS
     Sensitivity  0.5 nm RMS
     Acquisition rate  30 fps
     Analysis rate (Full resolution)  1 fps
     Dimensions (W x H x L) (mm)  95 x 105 x 84
     Weight  900 g
     Sensor technology  CCD

     

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Kaleo-T-Visible

Wavelength range: 350–1100 nm

  •  Wavelength range  350–1100 nm
     Aperturedimension (mm²)  3.6 x 4.8
     Spatial resolution  29.6 μm
     Phase and intensity sampling  160 x 120
     Accuracy (Absolute)  10 nm RMS
     Sensitivity  3 nm RMS
     Acquisition rate  60 fps
     Analysis rate (Full resolution)  > 10 fps
     Dimensions (W x H x L) (mm)  49 x 35 x 110
     Weight  250 g
     Sensor technology  CCD

     

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Kaleo-T-Visible-HR

Wavelength range: 350–1100 nm

  •  Wavelength range  350–1100 nm
     Aperturedimension (mm²)  8.9 x 11.8
     Spatial resolution  29.6 μm
     Phase and intensity sampling  300 x 400
     Accuracy (Absolute)  10 nm RMS
     Sensitivity  2 nm RMS
     Acquisition rate  10 fps
     Analysis rate (Full resolution)  > 3 fps
     Dimensions (W x H x L) (mm)  76 x 63 x 132
     Weight  620 g
     Sensor technology  CCD

     

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Kaleo-T-SID4 IR-MCT

Wavelength range: 1,2–5μm

  •  Wavelength range  1,2–5μm
     Aperturedimension (mm²)  9.6 x 7.68
     Spatial resolution  60 μm
     Phase and intensity sampling  160 x 128
     Accuracy (Absolute)  10 nm RMS
     Sensitivity  3 nm RMS
     Acquisition rate  140 fps
     Analysis rate (Full resolution)  20 fps
     Dimensions (W x H x L) (mm)  135 x 140 x 240
     Weight   3.5 Kg
     Sensor technology  Cooled MCT

     

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Kaleo-T-DWIR

Wavelength range: 3–5 & 8–14 μm

  •  Aperture dimension  13.44 x 10.08 mm2
     Spatial resolution  140 µm
     Sampling  96 x 72
     Wavelength range  3 - 5 µm and 8 - 14 µm
     Accuracy
     75 nm RMS
     Sensitivity  25 nm RMS
     Analysis rate  20 fps
     Acquisition rate
     50 fps
     Dimensions (l x H x L)
     85 x 116 x 179 mm
     Weight  Approx. 1.6kg

     

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Kaleo-T-LWIR 640

Wavelength range: 8–14 μm

  •  Aperture dimension  16 x 12 mm2
     Spatial resolution  100 µm
     Sampling  160 x 120
     Wavelength range  8 - 14 µm
     Accuracy (absolute/relative mode)
     75 nm RMS / 25 nm RMS
     Sensitivity  25 nm RMS
     Analysis rate  24 fps
     Acquisition rate
     50 fps
     Dimensions (l x H x L)
     96x110x90 mm
     Weight  850 g

     

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Direct Measurement
Measuring diverging and converging beams with no relay lens, Phasics sensor enables compact direct set-up:
● Simple alignment
● Same setup to cover your full optics range
● Characterization in working conditions
● Easy measurement interpretation
 

High Resolution
The unrivalled high resolution of Phasics sensor ensures reliability, by enabling robust calculations
and small defects detection.
● Up to 300 x 400 measurement points
● Nanometer level axial resolution
 

High Dynamics
Phasics sensor measures strongly aberrated optics to detect non-compliant subassemblies before assembly. It also measures aspheric lenses in transmission.
 

Stability
Phasics technology does not use reference beam, making it unsensitive to vibrations.
 

Achromaticity
Inherently achromatic, Phasics technology makes possible measurement at any wavelength without any calibration:
● Focus shift with wavelength
● MTF comparison at various wavelengths

 

Easy and rigorous analysis
Taking advantage of our technology, the software solution ensures reliable calculation and offers flexibility:
● focusing methods (best or paraxial focus, MTF autofocus)
● pupil size
● advanced filtering options

Direct phase measurement makes possible advanced analysis while simplifying the result interpretation.

Serving the ease of use of Phasics solution, it manages measurement from settings and acquisition to advanced calculations: Lens database - Alignment helpers - Automated reports

DesignPro module
From the optical design file, this module simulates the nominal phase in the measurement plane and delivers the residual wavefront error (WFE)



RetroPro module 1
Direct measurement enables back propagating the measured wavefront to provide the OPD information in the exit pupil of the tested element. The measurement can then easily be compared to optical design. It is of real interest for off axis measurement interpretation.

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