SID4 HR

Wavefront Sensor

● High resolution (160x120 points)
● Achromaticity
● High stability of the measurement
● Insensitive to vibration
● Ease of use, Firewire IEEE 1394
● Compactness : controlled with laptop
  • 型號
  • 產品概述
  • 庫存
  • 詢價數量
  • 詢價車
SID4

Wavelength range: 350 nm to 1100 nm

  •  Aperture dimension  3.6 x 4.8 mm2
     Spatial resolution  29.6 µm
     Sampling  160 x 120 (> 19 000 points)
     Wavelength range  350 nm to 1100 nm
     Precision (absolute/relative)  10 nm RMS / 3 nm RMS
     Repeatability  3 nm RMS
     Dynamic  > 100 µm
     Acquisition frequency  60 fps
     Real-time processing frequency  > 10 fps (full resolution)
     Dimensions (l x H x L)  49 x 35 x 110 mm
     Weight  250 g

     

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SID4-HR

Wavelength range: 350 nm to 1100 nm

  •  Aperture dimension  8.9 x 11.8 mm2
     Spatial resolution  29.6 µm
     Sampling  300 x 400 ( >120 000 points )
     Wavelength range  350 nm to 1100 nm
     Precision (absolute/relative)  10 nm RMS / 2 nm RMS
     Repeatability  2 nm RMS
     Dynamic  > 500 µm
     Acquisition frequency  10 fps
     Real-time processing frequency  > 3 fps (full resolution)
     Dimensions (l x H x L)  76 x 63 x 132 mm
     Weight  620 g

     

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SID4 UV-HR

Wavelength range: 190 - 400 nm

  •  Aperture dimension  8.0 x 8.0 mm2
     Spatial resolution  32 µm
     Sampling  250 x 250
     Wavelength range  190 - 400 nm
     Precision (absolute/relative)  10 nm RMS
     Repeatability  0.5 nm RMS
     Dynamic  > 200 µm
     Sensitivity curvature measurement  <5. 10-4 m-1
     Analysis rate
     1 fps
     Acquisition rate
     30 fps
     Dimensions (l x H x L)  95 x 105 x 84 mm
     Weight  900 g

     

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SID4 NIR

Wavelength range: 1.5 - 1.6 µm

  •  Aperture dimension  3.6 x 4.8 mm2
     Spatial resolution  29.6 µm
     Sampling  160 x 120
     Wavelength range  1.5 - 1.6 µm
     Accuracy  > 15 nm RMS
     Sensitivity  < 11 nm RMS
     Dynamic  > 100 µm
     Analysis rate  < 10 fps
     Acquisition rate
     60 fps
     Dimensions (l x H x L)
     44x33x57.5 mm
     Weight  250 g

     

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SID4 DWIR

Wavelength range: 3 - 5 µm and 8 - 14 µm

  •  Aperture dimension  13.44 x 10.08 mm2
     Spatial resolution  140 µm
     Sampling  96 x 72
     Wavelength range  3 - 5 µm and 8 - 14 µm
     Accuracy
     75 nm RMS
     Sensitivity  25 nm RMS
     Analysis rate  20 fps
     Acquisition rate
     50 fps
     Dimensions (l x H x L)
     85 x 116 x 179 mm
     Weight  Approx. 1.6kg

     

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SID4 LWIR-640

Wavelength range: 8 - 14 µm

  •  Aperture dimension  16 x 12 mm2
     Spatial resolution  100 µm
     Sampling  160 x 120
     Wavelength range  8 - 14 µm
     Accuracy (absolute/relative mode)
     75 nm RMS / 25 nm RMS
     Sensitivity  25 nm RMS
     Analysis rate  24 fps
     Acquisition rate
     50 fps
     Dimensions (l x H x L)
     96x110x90 mm
     Weight  850 g

     

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SID4 IR-MCT

Wavelength range: 1.2 - 5.5 µm

  •  Aperture dimension  9.60 x 7.68 mm2
     Maximum aperture  F/1
     Spatial resolution  60 µm
     Sampling  160 x 128
     Wavelength range  1.2 - 5.5 µm
     Sensitivity  3 nm RMS @ 3µ>/cm2
     Dynamic range  >300 µm
     Analysis rate (full resolution)  >20 fps
     Acquisition rate
     140 fps
     Detection technology  Cooled MCT
     Dimensions (l x H x L)
     135x140x240 mm
     Weight  ~3.5 kg

     

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Software for laser metrology
SID4 wavefront sensors are associated with a complete electromagnetic field analysis software. It integrates a high resolution phase map and at the same time the intensity profile and the phase map.

Software description
● Phase interpretation modules
    - Tilt
    - Divergence
    - Zernike polynomials
    - Legendre polynomials
    - Beam alignment assistant
● Ergonomics
    - Intuitive software
    - Multi-user interface
    - Automatic mask adjustement
● Laser beam analysis
    - Phase and Intensity
    - M² measurement
    - Strehl Ratio
    - Far-Field analysis
● Beam View (option)
    - Complete beam analysis
    - Intensity profiles
    - Gaussian fit

Software advantages for laser metrology
● SID4 high resolution offers an accurate analysis of the results
● Software analyses circular or rectangular pupils and automatically adapts to the right projection base: Zernike or Legendre
● SID4 lateral shearing interferometry technology allows an easy alignment procedure: Fourier Transform analysis strongly reduces tip/tilt alignment
● Different users measurement parameters are associated with a specific profile allowing a multi-user access
● With programming module library (Software Development Kit) in Labview and C++, you can include phase measurement and various interpretation modules in your own programs for a customized use

Beamview
With Beamview, SID4 allows at the same time strong laser beam wavefront and intensity profiles.

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